A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems

نویسندگان

  • Indradeep Ghosh
  • Niraj K. Jha
  • Sujit Dey
چکیده

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عنوان ژورنال:
  • IEEE Trans. on CAD of Integrated Circuits and Systems

دوره 18  شماره 

صفحات  -

تاریخ انتشار 1997